Semiconductor IC Testing Lab Services
Electronics Testing services
Our Semiconductor IC testing lab team located in Bangalore, India of highly skilled and dedicated professionals is committed to providing exceptional customer service. Our IC failure analysis services lab use the latest technology and industry trends to offer cutting-edge solutions to meet our client needs
Electronic products teardown services
- 3D CT X-Ray microscope visual inspection
- SMT Component dismount and de-soldering
- IC Decapsulation
- DIE Layout Inspection
- FIB-TEM Die de-layering studies
Semiconductor IC testing lab and IC failure analysis service
DC and Device Probe Station
- Probe stations includes microscope/video system, vibration isolation table, probe card holders, RF and SMU DC probes needles calibration software and standards.
- Measurements of IV, Id-Vd, Id-Vg, Break down, Carrier Recombination, Reliability life time, Pulsed Id-Vd.
- Determining Mobility and Threshold Voltage in CMOS, RF MMIC and Memory devices.
- Test and pad structure design to extract Threshold Voltages, Body effect, Transconductance, Channel doping simulation.
- Specs : -100 V to +100 V
- Sweeps: -100 mA to +100 mA
- Resolution : 10 fAmps,0.05 uVolts.
- Pulse : Max 10V, 10mA.
- Temperature : 20C to 200C.
Passive component testing
- CV Impedance Dissipation factor on passive components.
- Mobile ion studies, SiOx and SiNx layer integrity.
- Determine breakdown voltages and IV's.
- Measurement of resistance,Capacitance, Carrier Recombination, Metal Insulator Metal profiles.
- AC Frequency : 40 Hz to 110 MHz.
- DC Voltage : +/- 40 V.
- AC Amplitude : 5 mV to 1 V.
- CV Frequency : 1 KHz to 5 MHz.
RF, MMIC, RF Antenna testing
- RF probe station for the research of advanced active and passive components. Stage comes with zoom microscope with 20X and 50 X magnification, LED ring Illuminator, precision x-y stage with RF probe tips.
- Determine Time -Domain -Gating mode, Pulsed RF, Return Loss, Impedance, Insertion Loss.
- Measurement and failure analysis Transmission Coefficient.
- Frequency conversion, S-Parameter, Antenna, Smith chart and signal integrity measurements.
- Frequency Range : 9 kHz to 70 GHz
- Impedance : 50 ohm or 75 ohm.
- Loss Parameter : 94 dB with 0.006 dB trace noise.
Solid State Device Physics
Solar PV Lifetime, Efficiency Tester
- Determine Isc, Jsc, Short Circuit Current Isc, Sun Voc, Open Circuit Voltage Voc slope, Shunt resistance.
- Measurement and result analysis of Maximum Power Pmax ( Vmax and Imax), FF, Fill Factor conversion efficiency, IQE, EQE, n-efficiency conversion and spectral response.
- Sample Size : 100m to 156 mm Si and pseudo squares.
- Bias Voltage : 0 to 200 V
- Current Resolution : 10 picoampere to 10 microampere.
PCB and IC Failure Analysis
- C-SAM Scanning Acoustic Microscope failure analysis on PCB for Interfacial delamination, Inter connects Joint, bonding, aseal analysis and Void detection.
- Printed circuit board anomalies, Encapsulated IC packages, PCB reverse engineering, Wafer bonding, PCB lamination, Ceramic packaging encapsulants, Interconnect via metal layers and Medical devices.
- Defect Resolution : 5 micron with 0.001mm length resolution.
- Transducers Range : 50, Mhz, 100 MHz, 150 MHz and 230 MHz.
Hall Mobility, Low temperature SQUID
- Hall Voltage, Carrier Concentration, Coefficient and Carrier mobility fabrication and characterization.
- 4 probe room and low temperature sheet resistance, Vacuum, Pulse IV, CV measurement.
- Low Temperature Liquid N2 and He Superconducting pulse measurement and analysis.
- Probe Bench : 5 Probes DC Supply.
- Probe Size :10 um to 3 um.
- Liquid N2 : 77 Kelvin to 400 Kelvin.
- Liquid He : 5 Kelvin to 500 Kelvin
- Magnet : +/- 2.5 Tesla
- Vacuum Pressure : 4.5 e-07 mBar.