1. Solder Joint Voids & Defects
- Detects voiding in BGA, QFN, and other bottom-terminated components.
- Identifies incomplete reflow, cold solder, or solder bridging.
2. Component Placement Issues
- Reveals lifted pads, insufficient solder wetting, or tombstoning defects.
- Detects misalignment and coplanarity issues in fine-pitch assemblies.
3. Layer & Via Integrity
- Inspects internal cracks or delamination in multilayer boards.
- Detects voids and non-uniform plating in microvias and through-holes.
4. Advanced 3D / CT Scanning / CSAM Inspection
- Allows reconstruction of internal layers for failure localization.
- Provides detailed insight into solder volume distribution and void percentage.
- X-ray inspection is a non-destructive method that allows internal visualization of PCBs without cross-sectioning. It is especially valuable for high-density and multilayer boards where critical features are not visible externally.
- CSAM (Confocal Scanning Acoustic Microscopy) : Non-destructive technique used to detect internal delamination, cracks, and voids in PCBs and IC packages, ensuring structural integrity without damaging the sample. CSAM is especially useful in high-reliability industries like automotive, aerospace, and medical electronics, where hidden internal defects can lead to catastrophic failures if undetected.