Semiconductor IC Electronics Testing Services
IC failure analysis lab services
Nanowatts IC failure analysis lab located Bangalore India is here to assist our clients in achieving top-tier product quality and reliability. Our dedication to this objective is exemplified by offering a one-stop solution for a wide range of IC FA and decapsulation services.
Consumer Electronics Products testing
IC and Passive Components
- Devices: ASIC, CMOS, Si, Si-Ge, III-V, GaAs.
- Semiconductor IC parametric tests.
- IC Counterfeit-authenticity investigation.
- Micro transformers.
- Device resistors, Capacitors and Inductors.
- PCBA's, PCB's, PWB's, BGA's.
- Device electrical characterization.
- IC Electronic materials testing.
Electronic Products
- PCBA's
- LED's
- Solar cells and Solar modules.
- Laser diodes.
- Medical Devices.
- Lithium Ion Batteries.
- Wearable devices.
- Environmental Monitoring Devices.
Product counterfeit detection
IC Counterfeit tests
- Thermal and near IR imaging services
- X-ray Inspections: 3D CT X-ray inspections, CT scans
- Electrical tests: Curve tracers, probe bench testers, key function testing
- Chemical tests: Permanency marking tests, blacktopping investigation, solvent and scrape testing services.
- Material Study: SEM/EDS, XRF, FTIR Polymer test
3D CT X-ray inspection services
Advanced IC X-ray Microscope Imaging Service
- Micro CT scan X-ray imagining systems.
- 3D X-ray Imaging services.
- 3D X-ray video's.
- 2D X-ray investigation.
- CT scans and video's of electronic products.
- Computed Tomography investigation for batteries.
- 2D and 3D Computed Tomography (CT) X-ray inspection of PCBA's for broken bond wires, delamination analysis on solder joint.
- 2D & 3D CT X-Ray scanning for automotive and casting parts.
- 2D & 3D CT X-Ray scanning for medical device assemblies.
- Computed Tomography plastic parts to identify voids, porosities, internal stress fractures failures.
- 2D & 3D CT X-Ray scanning for 3D printed products, additive manufacturing parts.
Material Science Testing
IC Material Analysis
- Nano micro elemental composition analysis.
- Grain size, sample cross section, surface morphology, surface defects and contamination defect studies.
- Polymer identification investigation. Identification of failure contamination of materials and failure root cause study.
- Tools : SEM-EDS, SEM-FIB, FTIR, XRF, XRR, XPS, ICPMS
PCB Test Engineering Services
PCB Circuit Board testing
- PCB microsectioning and metallographic investigation.
- PCB metal layers, fillers, polymer
- Scanning Acoustic Microscopy services C-SAM
- In depth 2D 3D CT X-ray microscope inspection
- Environmental Stress Screening (ESS) services
- Toxicity and environmental quality assessments
- In Circuit (ICT) and Flying probe solutions
IC Semiconductor Testing Services
Advanced IC Testing Services
- Visit Semiconductor IC Testing Services for semiconductor electrical characterization.
- Capacitor failure : Multilayer chip capacitors (MLCC), Metallic capacitors, Electrolytic capacitors, Thin film capacitors testing.
- Inductor analysis : Failure due to corrosion, defective solder joints, electrical overstress shorting issues, defect magnet wires.
- Diode testing : Failure due to electrical over stress, electro station discharge issues, porosity troubleshooting.
- Resistor testing : Chip resistors micro sectioning services, metal plating issues, corrosion testing, fracture origin testing.
- PCB Failure analysis: Metal via inner layer separation testing, crazing & measling board studies, delamination of the mount testing, corrosion issues, failing shorts due conductive anodic filament, rework damage quality control assessment.