Semiconductor Measurement and Failure Analysis
CV Impedance Test and Analyser.
Ideal Uses :
- CV Impedance Dissipation factor on passive components.
- Mobile ion studies, SiOx and SiNx layer integrity.
- Determine breakdown voltages and IV's.
- Measurement of resistance,Capacitance, Carrier Recombination, Metal Insulator Metal profiles.
- AC Frequency : 40 Hz to 110 MHz.
- DC Voltage : +/- 40 V.
- AC Amplitude : 5 mV to 1 V.
- CV Frequency : 1 KHz to 5 MHz.
DC and Device Probe Station.
Ideal Uses :
- Probe stations includes microscope/video system, vibration isolation table, probe card holders, RF and SMU DC probes needles calibration software and standards.
- Measurements of IV, Id-Vd, Id-Vg, Break down, Carrier Recombination, Reliability life time, Pulsed Id-Vd.
- Determining Mobility and Threshold Voltage in CMOS, RF MMIC and Memory devices.
- Test and pad structure design to extract Threshold Voltages, Body effect, Transconductance, Channel doping simulation.
- Specs : -100 V to +100 V
- Sweeps: -100 mA to +100 mA
- Resolution : 10 fAmps,0.05 uVolts.
- Pulse : Max 10V, 10mA.
- Temperature : 20C to 200C.
RF, MMIC, RF Antenna Measurements
Ideal Uses :
- RF probe station for the research of advanced active and passive components. Stage comes with zoom microscope with 20X and 50 X magnification, LED ring Illuminator, precision x-y stage with RF probe tips.
- Determine Time -Domain -Gating mode, Pulsed RF, Return Loss, Impedance, Insertion Loss.
- Measurement and failure analysis Transmission Coefficient.
- Frequency conversion, S-Parameter, Antenna, Smith chart and signal integrity measurements.
- Frequency Range : 9 kHz to 70 GHz
- Impedance : 50 ohm or 75 ohm.
- Loss Parameter : 94 dB with 0.006 dB trace noise.
Solar, PCB, and Solid State Measurements
Solar PV Lifetime, Efficiency Tester.
Ideal Application :
- Determine Isc, Jsc, Short Circuit Current Isc, Sun Voc, Open Circuit Voltage Voc slope, Shunt resistance Rs.
- Measurement and result analysis of Maximum Power Pmax ( Vmax and Imax), FF, Fill Factor conversion efficiency, IQE, EQE, n-efficiency conversion and spectral response.
- Sample Size : 100m to 156 mm Si and pseudo squares.
- Bias Voltage : 0 to 200 V
- Current Resolution : 10 picoampere to 10 microampere.
PCB and IC Failure Analysis
Ideal Application :
- C-SAM Scanning Acoustic Microscope failure analysis on PCB for Interfacial delamination, Inter connects Joint, bonding, aseal analysis and Void detection.
- Printed circuit board anomalies, Encapsulated IC packages, PCB reverse engineering, Wafer bonding, PCB lamination, Ceramic packaging encapsulants, Interconnect via metal layers and Medical devices.
- Defect Resolution : 5 micron with 0.001mm length resolution.
- Transducers Range : 50, Mhz, 100 MHz, 150 MHz and 230 MHz.
Hall Mobility, Low temperature SQUID
Ideal Application :
- Hall Voltage,Carrier Concentration, Coefficient and Carrier mobility.
- 4 probe room and low temperature sheet resistance, Vacuum, Pulse IV, CV measurement.
- Low Temperature Liquid N2 and He Superconducting pulse measurement and analysis.
- Probe Bench : 5 Probes DC Supply.
- Probe Size :10 um to 3 um.
- Liquid N2 : 77 Kelvin to 400 Kelvin.
- Liquid He : 5 Kelvin to 500 Kelvin
- Magnet : +/- 2.5 Tesla
- Vacuum Pressure : 4.5 e-07 mBar.